著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Sinclair, Robert and Smith, David J. and Dahmen, Ulrich and Materials Research Society","High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, USA",,Materials Research Society,1990,Materials Research Society symposium proceedings,,1558990720,,https://cir.nii.ac.jp/crid/1130282271777947392