著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Bushnell, Michael L. (Michael Lee) and Agrawal, Vishwani D.","Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits",,Kluwer Academic,2000,Frontiers in electronic testing,,0792379918,,https://cir.nii.ac.jp/crid/1130282271821493376