Microelectronic test pattern NBS-4

CiNii Available at 1 libraries

Bibliographic Information

Title
"Microelectronic test pattern NBS-4"
Statement of Responsibility
W. Robert Thurber and Martin G. Buehler
Publisher
  • U.S. G.P.O.
Publication Year
  • 1978
Book size
26 cm

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Notes

Includes bibliographical references

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Details 詳細情報について

  • CRID
    1130282271964383616
  • NII Book ID
    BB18757237
  • Text Lang
    en
  • Country Code
    us
  • Title Language Code
    en
  • Place of Publication
    • Washington
  • Data Source
    • CiNii Books
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