著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Pollak, Fred H. and Society of Photo-optical Instrumentation Engineers","Spectroscopic characterization techniques for semiconductor technology II : January 21-22, 1985, Los Angeles, California",,SPIE -- the International Society for Optical Engineering,1985,Proceedings,,0892525592,,https://cir.nii.ac.jp/crid/1130282271986205568