著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"International Autumn Meeting, Gettering and Defect Engineering in Semiconductor Technology and Richter, Hans and Kittler, Martin and Claeys, Cor","Gettering and deffect engineering in semiconductor technology : GADEST '95 : proceedings of the 6th International Autumn Meeting, held in Parkhotel Schloß Wulkow, near Berlin, Germany, September 02-07, 1995",,SciTec Publications,1995,Diffusion and defect data : solid state data,,390845011X,,https://cir.nii.ac.jp/crid/1130282272030028928