著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Bullis, M. Murray","Methods of measurement for semiconductor materials, process control, and devices: quarterly report, January 1 to March 31, 1969",,"U.S. Dept. of Commerce, National Bureau of Standards,For sale by the Superintendent of Documents, U.S. Govt. Print. Off.",1969,NBS technical note,,,,https://cir.nii.ac.jp/crid/1130282272254675328