著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Derickson, Dennis and Müller, Marcus",Digital communications test and measurement : high-speed physical layer characterization,,Prentice Hall,2008,Modern semiconductor design series,,9780133359480,,https://cir.nii.ac.jp/crid/1130282272306132224