著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Auciello, Orlando and Krauss, Alan Robert",In situ real-time characterization of thin films,,J. Wiley,2001,A Wiley-Interscience publication,,0471241415,,https://cir.nii.ac.jp/crid/1130282272408206464