著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Harman, George G.",Nondestructive tests used to insure the integrity of semiconductor devices with emphasis on acoustic emission techniques,,U.S. G.P.O.,1979,NBS special publication,,,,https://cir.nii.ac.jp/crid/1130282272876177408