著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Society of Photo-optical Instrumentation Engineers and Chin, Aland K. and Dutta, Niloy K and Herrick, Robert W. and Linden, Kurt J. and McGraw, Daniel J.","Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA",,SPIE,2002,Proceedings,,0819443875,,https://cir.nii.ac.jp/crid/1130282272895959936