著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Feldman, Leonard C. and Mayer, James W.",Fundamentals of surface and thin film analysis,,North-Holland : Elsevier Science Pub.,1986,,,0444009892,,https://cir.nii.ac.jp/crid/1130282273067384960