著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Kaupp, G. (Gerd)","Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces",,Springer,2006,Nanoscience and technology,,"3540284052,9783642066634",,https://cir.nii.ac.jp/crid/1130282273315370624