著者名,書名,版表示,出版者名,出版年,シリーズ名,番号,ISBN,ISSN,URL
"Kelly, Joe, Ph. D. and Engelhardt, Michael","Advanced production testing of RF, SoC, and SiP devices",,Artech House,2007,The Artech House microwave library,,9781580537094,,https://cir.nii.ac.jp/crid/1130854869949147780