著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Masahito Niibe and Takuya Kotaka and Retsuo Kawakami and Takeshi Inaoka and Kikuo Tominaga and Takashi Mukai,Damage Analysis of Plasma-Etched n-GaN Crystal Surface by Nitrogen K Near-Edge X-ray Absorption Fine Structure Spectroscopy,Japanese Journal of Applied Physics,0021-4922,IOP Publishing,2012-01-01,51,1S,01AB02,https://cir.nii.ac.jp/crid/1360003446856686976,https://doi.org/10.1143/jjap.51.01ab02