著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Jingxin Jiang and Tatsuya Toda and Mai Phi Hung and Dapeng Wang and Mamoru Furuta,Highly stable fluorine-passivated In–Ga–Zn–O thin-film transistors under positive gate bias and temperature stress,Applied Physics Express,1882-0778,IOP Publishing,2014-11-01,7,11,114103,https://cir.nii.ac.jp/crid/1360003449884279168,https://doi.org/10.7567/apex.7.114103