著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Qinghua Wang and Shien Ri and Peng Xia,Wide-view and accurate deformation measurement at microscales by phase extraction of scanning moiré pattern with a spatial phase-shifting technique,Applied Optics,1559-128X,Optica Publishing Group,2021-02-16,60,6,1637,https://cir.nii.ac.jp/crid/1360009142742441728,https://doi.org/10.1364/ao.416742