Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Milan Tapajna and Nicole Killat and Vassil Palankovski and Dagmar Gregusova and Karol Cico and Jean-Francois Carlin and Nicolas Grandjean and Martin Kuball and Jan Kuzmik,Hot-Electron-Related Degradation in InAlN/GaN High-Electron-Mobility Transistors,IEEE Transactions on Electron Devices,0018-9383,Institute of Electrical and Electronics Engineers (IEEE),2014-08,61,8,2793-2801,https://cir.nii.ac.jp/crid/1360011146514877056,https://doi.org/10.1109/ted.2014.2332235