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Evaluation of Intrinsic Gettering of Gold by Oxide Precipitation in Czochralski Silicon
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- D. Bruce Masson
- Boeing Electronics, Seattle, Washington 98124
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- Doug A. Pietila
- Boeing Electronics, Seattle, Washington 98124
Bibliographic Information
- Published
- 1988-03-01
- Rights Information
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- https://iopscience.iop.org/page/copyright
- https://iopscience.iop.org/info/page/text-and-data-mining
- DOI
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- 10.1149/1.2095716
- Publisher
- The Electrochemical Society
Search this article
Journal
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- Journal of The Electrochemical Society
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Journal of The Electrochemical Society 135 (3), 686-690, 1988-03-01
The Electrochemical Society
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Keywords
Details 詳細情報について
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- CRID
- 1360016866775208192
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- ISSN
- 19457111
- 00134651
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- Data Source
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- Crossref
