著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Yosuke Katano and Yukihiro Kozai and Satoshi Okada and Takuho Mitsunaga,Prediction of Infected Devices Using the Quantification Theory Type 3 Based on MITRE ATT&CK Technique,2022 IEEE International Conference on Computing (ICOCO),,IEEE,2022-11-14,,,,https://cir.nii.ac.jp/crid/1360017285973115904,https://doi.org/10.1109/icoco56118.2022.10031822