著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI) Goon Tan and Sang Hyo Kweon and Kenji Shibata and Tomoaki Yamada and Isaku Kanno,"In Situ XRD Observation of Crystal Deformation of Piezoelectric (K,Na)NbO3 Thin Films",ACS Applied Electronic Materials,2637-6113,American Chemical Society (ACS),2020-07-06,2,7,2084-2089,https://cir.nii.ac.jp/crid/1360017289900919168,https://doi.org/10.1021/acsaelm.0c00324