Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Michael A. Stephens,Goodness of Fit Tests with Special Reference to Tests for Exponentiality,,,Defense Technical Information Center,1978-09-18,,,,https://cir.nii.ac.jp/crid/1360017290120056576,https://doi.org/10.21236/ada060824