{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1360021394464120576.json","@type":"Article","productIdentifier":[{"identifier":{"@type":"DOI","@value":"10.1109/emceurope48519.2020.9245787"}},{"identifier":{"@type":"URI","@value":"http://xplorestaging.ieee.org/ielx7/9245449/9245605/09245787.pdf?arnumber=9245787"}}],"dc:title":[{"@value":"Aggregation Effect of Radiated Disturbances from Multiple Emitters on the Limit-Setting Model"}],"description":[{"notation":[{"@value":"The effect of the aggregation of radiated disturbances from multiple emitters on the limit-setting model for radio protection is studied. The mean value of decibel-scaled interference power with and without aggregation are compared under the condition that the distance from the victim receiver to an emitter is lower-bounded by the protection distance. It is found that there is a critical emitter density beyond which the mean aggregate interference power exceeds the interference power from a single emitter located at a protection distance, which leads to the necessity of reduction (tightening) of a limit. Under low density and high propagation loss conditions, in contrast, the total received power is predominantly affected only by the nearest emitter, i.e., the model approaches to a single-emitter interference model. On the basis of the above results, we discuss how the interference aggregation effect can be introduced into the conventional limit-setting model."}]}],"creator":[{"@id":"https://cir.nii.ac.jp/crid/1380021394464120576","@type":"Researcher","foaf:name":[{"@value":"Kaoru Gotoh"}]},{"@id":"https://cir.nii.ac.jp/crid/1380021394464120577","@type":"Researcher","foaf:name":[{"@value":"Yukio Yamanaka"}]},{"@id":"https://cir.nii.ac.jp/crid/1380021394464120578","@type":"Researcher","foaf:name":[{"@value":"Yasushi Matsumoto"}]}],"publication":{"prism:publicationName":[{"@value":"2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE"}],"dc:publisher":[{"@value":"IEEE"}],"prism:publicationDate":"2020-09-23","prism:startingPage":"1","prism:endingPage":"4"},"reviewed":"false","dc:rights":["https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html","https://doi.org/10.15223/policy-029","https://doi.org/10.15223/policy-037"],"url":[{"@id":"http://xplorestaging.ieee.org/ielx7/9245449/9245605/09245787.pdf?arnumber=9245787"}],"createdAt":"2020-11-06","modifiedAt":"2022-06-27","relatedProduct":[{"@id":"https://cir.nii.ac.jp/crid/1360021389826276096","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Effects of Increasing Number of Disturbance Sources on the Setting of Emission Limits"}]}],"dataSourceIdentifier":[{"@type":"CROSSREF","@value":"10.1109/emceurope48519.2020.9245787"},{"@type":"OPENAIRE","@value":"doi_dedup___::0de48ba26b2cbf08f3159419a597590d"},{"@type":"CROSSREF","@value":"10.1109/temc.2023.3283546_references_DOI_7q8rxj1o2kDXaY54dL7Xp4NU1Z4"}]}