{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1360022497271623936.json","@type":"Article","productIdentifier":[{"identifier":{"@type":"DOI","@value":"10.1109/iscas.1996.541972"}},{"identifier":{"@type":"URI","@value":"http://xplorestaging.ieee.org/ielx3/3834/11198/00541972.pdf?arnumber=541972"}}],"dc:title":[{"@value":"Offset reduction in current-mode microsystems"}],"creator":[{"@id":"https://cir.nii.ac.jp/crid/1380022497271623937","@type":"Researcher","foaf:name":[{"@value":"A. Bakker"}]},{"@id":"https://cir.nii.ac.jp/crid/1380022497271623936","@type":"Researcher","foaf:name":[{"@value":"J.H. Huijsing"}]}],"publication":{"prism:publicationName":[{"@value":"1996 IEEE International Symposium on Circuits and Systems. Circuits and Systems Connecting the World. ISCAS 96"}],"dc:publisher":[{"@value":"IEEE"}],"prism:volume":"4","prism:startingPage":"344","prism:endingPage":"347"},"reviewed":"false","url":[{"@id":"http://xplorestaging.ieee.org/ielx3/3834/11198/00541972.pdf?arnumber=541972"}],"createdAt":"2002-12-24","modifiedAt":"2017-03-09","relatedProduct":[{"@id":"https://cir.nii.ac.jp/crid/1390001204379433344","@type":"Article","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@language":"en","@value":"An Ultra-Low Voltage Analog Front End for Strain Gauge Sensory System Application in 0.18µm CMOS"}]}],"dataSourceIdentifier":[{"@type":"CROSSREF","@value":"10.1109/iscas.1996.541972"},{"@type":"CROSSREF","@value":"10.1587/transele.e95.c.733_references_DOI_MjidB4QMnGN64z1ECTmHJFDpaEi"}]}