著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
M. V. Fischetti and S. Jin and T.-W. Tang and P. Asbeck and Y. Taur and S. E. Laux and M. Rodwell and N. Sano,"Scaling MOSFETs to 10 nm: Coulomb effects, source starvation, and virtual source model",Journal of Computational Electronics,1569-8025,Springer Science and Business Media LLC,2009-06,8,2,60-77,https://cir.nii.ac.jp/crid/1360283690368242176,https://doi.org/10.1007/s10825-009-0277-z