New perspectives in the surface analysis of energy materials by combined time-of-flight secondary ion mass spectrometry (ToF-SIMS) and high sensitivity low-energy ion scattering (HS-LEIS)

Details 詳細情報について

• CRID

  1360283691858146304

• DOI

  10.1039/c3ja50292a

• ISSN

  13645544

  02679477

• Web Site

  http://pubs.rsc.org/en/content/articlepdf/2014/JA/C3JA50292A

• Data Source

  • Crossref
  • KAKEN