Stereoregularity effect on hole mobility in poly(<i>N</i>-vinylcarbazole) thin film evaluated by MIS-CELIV method

詳細情報 詳細情報について

• CRID

  1360284924859704064

• NII論文ID

  210000157534

• DOI

  10.7567/1347-4065/ab554f

• ISSN

  13474065

  00214922

• Web Site

  http://iopscience.iop.org/article/10.7567/1347-4065/ab554f

  http://iopscience.iop.org/article/10.7567/1347-4065/ab554f/pdf

  https://iopscience.iop.org/article/10.7567/1347-4065/ab554f/pdf

  https://iopscience.iop.org/article/10.7567/1347-4065/ab554f

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