Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Miori Hiraiwa and Fei Liu and Satoshi Shibata and Shingo Takeda and Yoshiyuki Tsusaka and Yasushi Kagoshima and Junji Matsui,Evaluation of a-type screw dislocations in<i>m</i>-GaN film by means of X-ray diffractometry,Japanese Journal of Applied Physics,0021-4922,IOP Publishing,2015-01-21,54,2,025503,https://cir.nii.ac.jp/crid/1360284924866477312,https://doi.org/10.7567/jjap.54.025503