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By taking the angle dependences of the fluorescent X‐ray intensity (hologram), 3D images of the surrounding atoms can be, in principle, obtained via simple Fourier transform‐like approaches with no special atomic models. In reality, however, an infinite number of the holograms with different incident X‐ray energies are necessary to reproduce the artifact‐less atomic images at the correct positions. Instead, here an inverse problem is applied using a sparse modeling approach of a L<jats:sub>1</jats:sub>‐regularized linear regression to solve such statistical problem of a small data size. The excellent results of this approach are presented on complex crystals of some functional materials, such as Mn doped Bi<jats:sub>2</jats:sub>Te<jats:sub>3</jats:sub> topological insulator, Fe<jats:sub>65</jats:sub>Ni<jats:sub>35</jats:sub> Invar alloy, and Fe chalcogenide high‐temperature 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functions"}]},{"@id":"https://cir.nii.ac.jp/crid/1040000782278598016","@type":"Project","projectIdentifier":[{"@type":"KAKEN","@value":"26105001"},{"@type":"JGN","@value":"JP26105001"},{"@type":"URI","@value":"https://kaken.nii.ac.jp/grant/KAKENHI-ORGANIZER-26105001/"}],"notation":[{"@language":"ja","@value":"３Ｄ活性サイト科学のプラットフォーム構築による総括と研究支援"},{"@language":"en","@value":"Supervision and research support by platform construction of 3D active-site science"}]},{"@id":"https://cir.nii.ac.jp/crid/1040282256843688448","@type":"Project","projectIdentifier":[{"@type":"KAKEN","@value":"15K21719"},{"@type":"JGN","@value":"JP15K21719"},{"@type":"URI","@value":"https://kaken.nii.ac.jp/grant/KAKENHI-INTERNATIONAL-15K21719/"}],"notation":[{"@language":"ja","@value":"3D活性サイト科学の海外拠点・国際ネットワーク構築"},{"@language":"en","@value":"Construction of oversea base and international network for 3D active site 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