Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Suguru Yamanaka and Hidetoshi Nakagawa and Masaaki Sugihara,Random thinning with credit quality vulnerability factor for better risk management of credit portfolio in a top-down framework,Japan Journal of Industrial and Applied Mathematics,0916-7005,Springer Science and Business Media LLC,2016-05-17,33,2,321-341,https://cir.nii.ac.jp/crid/1360285706533154560,https://doi.org/10.1007/s13160-016-0216-x