著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Eiji Arima and Huanfei Wen and Yoshitaka Naitoh and Yan Jun Li and Yasuhiro Sugawara,Development of low temperature atomic force microscopy with an optical beam deflection system capable of simultaneously detecting the lateral and vertical forces,Review of Scientific Instruments,0034-6748,AIP Publishing,2016-09-01,87,9,093113,https://cir.nii.ac.jp/crid/1360285708895363712,https://doi.org/10.1063/1.4962865