Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Celano,Electrical Atomic Force Microscopy for Nanoelectronics,NanoScience and Technology,1434-4904,Springer International Publishing,2019,,,,https://cir.nii.ac.jp/crid/1360294646605191808,https://doi.org/10.1007/978-3-030-15612-1