著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
S. Shahjahan and A. Aubry and F. Rupin and B. Chassignole and A. Derode,A random matrix approach to detect defects in a strongly scattering polycrystal: How the memory effect can help overcome multiple scattering,Applied Physics Letters,0003-6951,AIP Publishing,2014-06-09,104,23,,https://cir.nii.ac.jp/crid/1360298342572123776,https://doi.org/10.1063/1.4882421