{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1360298342572123776.json","@type":"Article","productIdentifier":[{"identifier":{"@type":"DOI","@value":"10.1063/1.4882421"}},{"identifier":{"@type":"URI","@value":"https://pubs.aip.org/aip/apl/article-pdf/doi/10.1063/1.4882421/13941438/234105_1_online.pdf"}}],"dc:title":[{"@value":"A random matrix approach to detect defects in a strongly scattering polycrystal: How the memory effect can help overcome multiple scattering"}],"description":[{"type":"abstract","notation":[{"@value":"<jats:p>We report on ultrasonic imaging in a random heterogeneous medium. The goal is to detect flaws embedded deeply into a polycrystalline material. A 64-element array of piezoelectric transmitters/receivers at a central frequency of 5 MHz is used to capture the Green's matrix in a backscattering configuration. Because of multiple scattering, conventional imaging completely fails to detect the deepest flaws. We utilize a random matrix approach, taking advantage of the deterministic coherence of the backscattered wave-field which is characteristic of single scattering and related to the memory effect. This allows us to separate single and multiple scattering contributions. As a consequence, we show that flaws are detected beyond the conventional limit, as if multiple scattering had been overcome.</jats:p>"}]}],"creator":[{"@id":"https://cir.nii.ac.jp/crid/1380016864723610755","@type":"Researcher","foaf:name":[{"@value":"S. Shahjahan"}],"jpcoar:affiliationName":[{"@value":"1EDF R&D, Materials and Mechanics of Components Department, EDF Lab Les Renardières, 77818 Moret sur Loing, France"}]},{"@id":"https://cir.nii.ac.jp/crid/1380298342572123780","@type":"Researcher","foaf:name":[{"@value":"A. Aubry"}],"jpcoar:affiliationName":[{"@value":"Université Paris Diderot-Paris 7 2 Institut Langevin, ESPCI ParisTech, CNRS, , 1 rue Jussieu, 75005 Paris, France"}]},{"@id":"https://cir.nii.ac.jp/crid/1380298342572123777","@type":"Researcher","foaf:name":[{"@value":"F. Rupin"}],"jpcoar:affiliationName":[{"@value":"1EDF R&D, Materials and Mechanics of Components Department, EDF Lab Les Renardières, 77818 Moret sur Loing, France"}]},{"@id":"https://cir.nii.ac.jp/crid/1380298342572123778","@type":"Researcher","foaf:name":[{"@value":"B. Chassignole"}],"jpcoar:affiliationName":[{"@value":"1EDF R&D, Materials and Mechanics of Components Department, EDF Lab Les Renardières, 77818 Moret sur Loing, France"}]},{"@id":"https://cir.nii.ac.jp/crid/1380298342572123779","@type":"Researcher","foaf:name":[{"@value":"A. Derode"}],"jpcoar:affiliationName":[{"@value":"Université Paris Diderot-Paris 7 2 Institut Langevin, ESPCI ParisTech, CNRS, , 1 rue Jussieu, 75005 Paris, France"}]}],"publication":{"publicationIdentifier":[{"@type":"PISSN","@value":"00036951"},{"@type":"EISSN","@value":"10773118"}],"prism:publicationName":[{"@value":"Applied Physics Letters"}],"dc:publisher":[{"@value":"AIP Publishing"}],"prism:publicationDate":"2014-06-09","prism:volume":"104","prism:number":"23"},"reviewed":"false","url":[{"@id":"https://pubs.aip.org/aip/apl/article-pdf/doi/10.1063/1.4882421/13941438/234105_1_online.pdf"}],"createdAt":"2014-06-13","modifiedAt":"2023-06-23","relatedProduct":[{"@id":"https://cir.nii.ac.jp/crid/2051151842060099712","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Estimating errors in autocorrelation functions for reliable investigations of reflection profiles"}]}],"dataSourceIdentifier":[{"@type":"CROSSREF","@value":"10.1063/1.4882421"},{"@type":"CROSSREF","@value":"10.1186/s40623-022-01606-5_references_DOI_4ucvowRnx5kjaoW9p9yECyfOVUl"}]}