著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Wei-Chen Li and Du-Ming Tsai,Wavelet-based defect detection in solar wafer images with inhomogeneous texture,Pattern Recognition,0031-3203,Elsevier BV,2012-02,45,2,742-756,https://cir.nii.ac.jp/crid/1360298342843415680,https://doi.org/10.1016/j.patcog.2011.07.025