著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Felix Palumbo and Chao Wen and Salvatore Lombardo and Sebastian Pazos and Fernando Aguirre and Moshe Eizenberg and Fei Hui and Mario Lanza,"A Review on Dielectric Breakdown in Thin Dielectrics: Silicon Dioxide, High‐<i>k</i>, and Layered Dielectrics",Advanced Functional Materials,1616-301X,Wiley,2019-04-30,30,18,1900657,https://cir.nii.ac.jp/crid/1360298760884648448,https://doi.org/10.1002/adfm.201900657