著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Sudhir K. Satpathy and Sanu K. Mathew and Raghavan Kumar and Vikram Suresh and Mark A. Anders and Himanshu Kaul and Amit Agarwal and Steven Hsu and Ram K. Krishnamurthy and Vivek De,An All-Digital Unified Physically Unclonable Function and True Random Number Generator Featuring Self-Calibrating Hierarchical Von Neumann Extraction in 14-nm Tri-gate CMOS,IEEE Journal of Solid-State Circuits,0018-9200,Institute of Electrical and Electronics Engineers (IEEE),2019-04,54,4,1074-1085,https://cir.nii.ac.jp/crid/1360298762221288320,https://doi.org/10.1109/jssc.2018.2886350