Advanced technologies for optimized sub-quarter-micrometer SOI CMOS devices

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Journal

IEEE Transactions on Electron Devices

IEEE Transactions on Electron Devices 45 (5), 1092-1098, 1998-05

Institute of Electrical and Electronics Engineers (IEEE)

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CRID

1360298763455159680
DOI

10.1109/16.669541
ISSN

00189383
Web Site

http://xplorestaging.ieee.org/ielx4/16/14610/00669541.pdf?arnumber=669541
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