著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Gregory Gay and Matt Staats and Michael Whalen and Mats P. E. Heimdahl,The Risks of Coverage-Directed Test Case Generation,IEEE Transactions on Software Engineering,0098-5589,Institute of Electrical and Electronics Engineers (IEEE),2015-08-01,41,8,803-819,https://cir.nii.ac.jp/crid/1360298764735600128,https://doi.org/10.1109/tse.2015.2421011