Proton-induced single-event effect and influence of annealing on multiple feature size NAND flash memory
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 58 (12), 126002-, 2019-11-29
IOP Publishing
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詳細情報 詳細情報について
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- CRID
- 1360566399836423040
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- NII論文ID
- 210000157593
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- ISSN
- 13474065
- 00214922
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- データソース種別
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