Proton-induced single-event effect and influence of annealing on multiple feature size NAND flash memory

詳細情報 詳細情報について

• CRID

  1360566399836423040

• NII論文ID

  210000157593

• DOI

  10.7567/1347-4065/ab5868

• ISSN

  13474065

  00214922

• Web Site

  http://iopscience.iop.org/article/10.7567/1347-4065/ab5868

  http://iopscience.iop.org/article/10.7567/1347-4065/ab5868/pdf

  https://iopscience.iop.org/article/10.7567/1347-4065/ab5868/pdf

  https://iopscience.iop.org/article/10.7567/1347-4065/ab5868

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