著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI) Tongmin Chen and Masashi Akabori and Yoshifumi Oshima,Strain mapping at the interface of InP/In x Ga1-x As/InP as measured by the scanning transmission electron microscope-moiré fringe method,Applied Physics Express,1882-0778,IOP Publishing,2019-10-01,12,10,105504,https://cir.nii.ac.jp/crid/1360566399836761216,https://doi.org/10.7567/1882-0786/ab4604