著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Kaoru Ohya,Simulation of secondary electron emission from a stepped surface in scanning ion microscopes,Japanese Journal of Applied Physics,0021-4922,IOP Publishing,2014-05-08,53,6S,06JB01,https://cir.nii.ac.jp/crid/1360566399842891776,https://doi.org/10.7567/jjap.53.06jb01