著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
J Alvarez and M Boutchich and J P Kleider and T Teraji and Y Koide,Direct observation of the leakage current in epitaxial diamond Schottky barrier devices by conductive-probe atomic force microscopy and Raman imaging,Journal of Physics D: Applied Physics,0022-3727,IOP Publishing,2014-08-13,47,35,355102,https://cir.nii.ac.jp/crid/1360567184344031104,https://doi.org/10.1088/0022-3727/47/35/355102