著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
V. Goiffon and P. Magnan and O. Saint-pe and F. Bernard and G. Rolland,Total Dose Evaluation of Deep Submicron CMOS Imaging Technology Through Elementary Device and Pixel Array Behavior Analysis,IEEE Transactions on Nuclear Science,0018-9499,Institute of Electrical and Electronics Engineers (IEEE),2008-12,55,6,3494-3501,https://cir.nii.ac.jp/crid/1360574095223882112,https://doi.org/10.1109/tns.2008.2005294