著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
F. Pfeiffer and M. Bech and O. Bunk and P. Kraft and E. F. Eikenberry and Ch. Brönnimann and C. Grünzweig and C. David,Hard-X-ray dark-field imaging using a grating interferometer,Nature Materials,1476-1122,Springer Science and Business Media LLC,2008-01-20,7,2,134-137,https://cir.nii.ac.jp/crid/1360574095923481984,https://doi.org/10.1038/nmat2096