著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Jing Guo and Shanshan Liu and Lei Zhu and Fabrizio Lombardi,Design and Evaluation of Low-Complexity Radiation Hardened CMOS Latch for Double-Node Upset Tolerance,IEEE Transactions on Circuits and Systems I: Regular Papers,1549-8328,Institute of Electrical and Electronics Engineers (IEEE),2020-06,67,6,1925-1935,https://cir.nii.ac.jp/crid/1360579819770914432,https://doi.org/10.1109/tcsi.2020.2973676