{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1360580240174794112.json","@type":"Article","productIdentifier":[{"identifier":{"@type":"DOI","@value":"10.1109/wacv.2019.00143"}},{"identifier":{"@type":"URI","@value":"http://xplorestaging.ieee.org/ielx7/8642793/8658235/08658401.pdf?arnumber=8658401"}}],"dc:title":[{"@value":"Local Gradients Smoothing: Defense Against Localized Adversarial Attacks"}],"creator":[{"@id":"https://cir.nii.ac.jp/crid/1380580240174794113","@type":"Researcher","foaf:name":[{"@value":"Muzammal Naseer"}]},{"@id":"https://cir.nii.ac.jp/crid/1380580240174794112","@type":"Researcher","foaf:name":[{"@value":"Salman Khan"}]},{"@id":"https://cir.nii.ac.jp/crid/1380580240174794114","@type":"Researcher","foaf:name":[{"@value":"Fatih Porikli"}]}],"publication":{"prism:publicationName":[{"@value":"2019 IEEE Winter Conference on Applications of Computer Vision (WACV)"}],"dc:publisher":[{"@value":"IEEE"}],"prism:publicationDate":"2019-01","prism:startingPage":"1300","prism:endingPage":"1307"},"reviewed":"false","dc:rights":["https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html","https://doi.org/10.15223/policy-029","https://doi.org/10.15223/policy-037"],"url":[{"@id":"http://xplorestaging.ieee.org/ielx7/8642793/8658235/08658401.pdf?arnumber=8658401"}],"createdAt":"2019-03-08","modifiedAt":"2022-07-19","relatedProduct":[{"@id":"https://cir.nii.ac.jp/crid/1360861707142497792","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"PatchCensor: Patch Robustness Certification for Transformers via Exhaustive Testing"}]}],"dataSourceIdentifier":[{"@type":"CROSSREF","@value":"10.1109/wacv.2019.00143"},{"@type":"CROSSREF","@value":"10.1145/3591870_references_DOI_KEIZsGb1X4iaW6idxeXheiRsQf0"}]}