著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Yifan Wu and Chi Li and Zedong Zheng and Lianzhong Wang and Wenxian Zhao and Qifeng Zou,A Behavior Model of SiC DMOSFET Considering Thermal-Runaway Failures in Short-Circuit and Avalanche Breakdown Faults,Electronics,2079-9292,MDPI AG,2024-03-06,13,5,996,https://cir.nii.ac.jp/crid/1360582947621273856,https://doi.org/10.3390/electronics13050996