著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
H. Funaki and Y. Yamaguchi and K. Hirayama and A. Nakagawa,Lateral SOI diode design optimization for high ruggedness and low temperature dependence of reverse recovery characteristics,Proceedings of the 10th International Symposium on Power Semiconductor Devices and ICs. ISPSD'98 (IEEE Cat. No.98CH36212),,Inst. Electr. Eng. Japan,2002-11-27,,,33-36,https://cir.nii.ac.jp/crid/1360585447909971712,https://doi.org/10.1109/ispsd.1998.702623