Synchrotron X-ray topography of dislocations in high-pressure high-temperature-grown single-crystal diamond with low dislocation density

詳細情報 詳細情報について

• CRID

  1360846646288985216

• NII論文ID

  210000137340

• DOI

  10.7567/apex.7.125501

• ISSN

  18820786

  18820778

  http://id.crossref.org/issn/18820786

• Web Site

  http://stacks.iop.org/1882-0786/7/i=12/a=125501/pdf

  http://stacks.iop.org/1882-0786/7/i=12/a=125501?key=crossref.d66803aa4854110903f09192a262aa7c

• データソース種別

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