Determination of the type of stacking faults in single-crystal high-purity diamond with a low dislocation density of <50 cm⁻² by synchrotron X-ray topography

<jats:title>Abstract</jats:title> <jats:p>The properties of stacking faults in a single-crystal high-purity diamond with a very low dislocation density of <50 cm<jats:sup>−2</jats:sup> and a very low impurity concentration of <0.1 ppm were investigated by synchrotron X-ray topography. We found stacking faults on the {111} plane and determined the fault vector <jats:bold>f</jats:bold> of the stacking faults to be <jats:inline-formula> <jats:tex-math><?CDATA $\textbf{f} = a/3\langle 111\rangle $?></jats:tex-math> <jats:inline-graphic xmlns:xlink="http://www.w3.org/1999/xlink" xlink:href="RC150096if001.gif" xlink:type="simple" /> </jats:inline-formula> on the basis of the <jats:bold>f</jats:bold> · <jats:bold>g</jats:bold> extinction criteria. Furthermore, we have found that the partial dislocations are of the Shockley type on the basis of the <jats:bold>b</jats:bold> · <jats:bold>g</jats:bold> extinction criteria. Consequently, we concluded that the stacking faults are of the Shockley type and formed because of the decomposition of dislocations with <jats:inline-formula> <jats:tex-math><?CDATA $\textbf{b} = a/2\langle 1\bar{1}0\rangle $?></jats:tex-math> <jats:inline-graphic xmlns:xlink="http://www.w3.org/1999/xlink" xlink:href="RC150096if002.gif" xlink:type="simple" /> </jats:inline-formula> into dislocations with <jats:inline-formula> <jats:tex-math><?CDATA $\textbf{b} = a/6\langle 2\bar{1}1\rangle $?></jats:tex-math> <jats:inline-graphic xmlns:xlink="http://www.w3.org/1999/xlink" xlink:href="RC150096if003.gif" xlink:type="simple" /> </jats:inline-formula> and <jats:inline-formula> <jats:tex-math><?CDATA $a/6\langle 1\bar{2}\bar{1}\rangle $?></jats:tex-math> <jats:inline-graphic xmlns:xlink="http://www.w3.org/1999/xlink" xlink:href="RC150096if004.gif" xlink:type="simple" /> </jats:inline-formula>.</jats:p>